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Fully automated optical profiling system for research and production applications.
Features:
- Sub-nanometer vertical resolution (down to 0.1 nm) at all magnifications
- Non-contact measurements allowing accurate and repeatable results
- All axes motorization enabling automatic stitching of multiples fields of view
- Automated measurement sequence
- Sub-nanometric roughness measurements
- Easy to use and production-ready
- Automated step height and surface flattening functions
INTERNET USERS ALSO CONSULTED ON THE CATEGORY SOIL ANALYSIS
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