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FOGALE NANOTECH

NEMS Solutions: Ultra performance solution for dynamic measurement in-plane and out-of-plane

Soil analysis

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Features:

- Available for the PhotoMap 3D and ZoomSurf 3D profilers.
- Dynamic characterization of vibrating MEMS allowing a precise measurement of in-plane and out-of-plane vibration mode shapes and deformations.
- Frequency range from 100 Hz to 2 MHz.
- Fully automated measurement technique.
- Measurement of amplitude and vibration phase maps for direct comparaison with finite element simulation results.
- Excitation electronics provide electrostatic (voltage), piezo electric (voltage) or thermal (current) actuation of MEMS.

OTHER PRODUCTS SOIL ANALYSIS FROM FOGALE NANOTECH

PHOTOMAP 3D: Interferometric sensor for fast D measurements

PHOTOMAP 3D: Interferometric sensor for fast D measurements

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MICROSURF 3D: Optical profiler for accurate and repeatable 3D metrology

MICROSURF 3D: Optical profiler for accurate and repeatable 3D metrology

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ZOOMSURF 3D for 3D measurements

ZOOMSURF 3D for 3D measurements

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CYBERSURF 3D: Automatic and manual semiconductor process control

CYBERSURF 3D: Automatic and manual semiconductor process control

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Inline Refractometer: L-Rix

Inline Refractometer: L-Rix

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GISAXS Stage 2.0

GISAXS Stage 2.0

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Standard flour viscometer : Amylograph-E

Standard flour viscometer : Amylograph-E

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Check out all the products from category soil analysis

See also

Gas analysis Chemical analysis Air analysis Water analysis Combustion analyzers Composition of liquids and density Composition of solids Electrodes, Measuring probes

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