PHOTOMAP 3D: Interferometric sensor for fast D measurements

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Presentation

Cost effective optical profiler with large customization capability for industrial and educational applications.

Features:

- Sub-nanometer vertical resolution (down to 0.1 nm) at all magnifications
- Non-contact measurements allowing accurate and repeatable results
- Large working area
- Automated step height and surface flattening function
- Sub-nanometric roughness measurements
- Compact

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