All you need to run your factory !
Cost effective optical profiler with large customization capability for industrial and educational applications.
Features:
- Sub-nanometer vertical resolution (down to 0.1 nm) at all magnifications
- Non-contact measurements allowing accurate and repeatable results
- Large working area
- Automated step height and surface flattening function
- Sub-nanometric roughness measurements
- Compact
INTERNET USERS ALSO CONSULTED ON THE CATEGORY SOIL ANALYSIS
See also
