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FOGALE NANOTECH

PHOTOMAP 3D: Interferometric sensor for fast D measurements

Soil analysis

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Cost effective optical profiler with large customization capability for industrial and educational applications.

Features:

- Sub-nanometer vertical resolution (down to 0.1 nm) at all magnifications
- Non-contact measurements allowing accurate and repeatable results
- Large working area
- Automated step height and surface flattening function
- Sub-nanometric roughness measurements
- Compact

OTHER PRODUCTS SOIL ANALYSIS FROM FOGALE NANOTECH

MICROSURF 3D: Optical profiler for accurate and repeatable 3D metrology

MICROSURF 3D: Optical profiler for accurate and repeatable 3D metrology

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ZOOMSURF 3D for 3D measurements

ZOOMSURF 3D for 3D measurements

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CYBERSURF 3D: Automatic and manual semiconductor process control

CYBERSURF 3D: Automatic and manual semiconductor process control

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NEMS Solutions: Ultra performance solution for dynamic measurement in-plane and out-of-plane

NEMS Solutions: Ultra performance solution for dynamic measurement in-plane and out-of-plane

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Check out all the products from category soil analysis

See also

Gas analysis Chemical analysis Air analysis Water analysis Combustion analyzers Composition of liquids and density Composition of solids Electrodes, Measuring probes

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