MICRO-EPSILON France

Inspection of reflecting surfaces with reflectCONTROL Compact

Inspection of reflecting surfaces with reflectCONTROL Compact - MICRO-EPSILON France

Inspection of reflecting surfaces with reflectCONTROL Compact - Optical profilometer

Inspection of reflecting surfaces with reflectCONTROL Compact - produit présenté par MICRO-EPSILON France

Inspection of reflecting surfaces with reflectCONTROL Compact

Optical profilometer

“ All-in-one: All components are integrated in a compact device. The housing includes a monitor for the striped pattern protection, as well as two cameras. In order to avoid interferences from ambient light, the measuring field can be darkened on all four sides. The legs are height-adjustable which enables to balance different component heights. This operation is performed via touch screen or mouse and keyboard, which can be connected via USB. reflectCONTROL Compact can be integrated into production lines. A digital I/O interface enables triggering and alarms. If the device is installed in a difficult-to-access place, an external operating monitor can be connected via VGA. The pre-installed operating and evaluation software of the 2D version shows surface defects. The 3D version provides a point cloud. The data obtained can be treated in the image processing programs. ”

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Presentation

On reflecting surfaces, restrictions are placed on conventional image processing systems. reflectCONTROL Compact from Micro-Epsilon has been specially developed for these types of surfaces.

reflectCONTROL Compact has been specifically developed for the inspection of lustrous surfaces. The system projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software.

The fully integrated system is available in two versions that each provides different measuring fields. The 2D version is used for pure defect recognition on reflecting surfaces. In addition, the 3D version allows for the measurement of reflecting surfaces at submicrometer accuracies. This device is also used in individual operations (e.g. laboratories) as well as directly in production lines.

Application examples

Inspection of touchscreens for smartphones and tablets
Default detection on car attachments and interior components
Measurement of telescope mirrors and lenses

Technical features

Fast and high resolution measurement on large surfaces up to 265 x 110mm Versions for defect recognition or 3D reconstruction Proven technology for offline inspection and integration into processing lines Interfaces: USB, VGA, Ethernet, Digital I/O

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